| Scanning Electron Microscopy and X-ray Microanalysis |  | Authors: Joseph Goldstein, Dale E. Newbury, David C. Joy, Charles E. Lyman, Patrick Echlin, Eric Lifshin, Linda Sawyer, J.R. Michael
Publisher: Springer
Category: Book
List Price: $99.00
Buy New: $77.22
as of 2/7/2012 14:20 PST details
You Save: $21.78 (22%)
In Stock
New (12) Used (25) from $56.30
Seller: textbooksnow-
Languages: English (Unknown), English (Original Language), English (Published)
Media: Hardcover
Edition: 3rd
Pages: 689
Number Of Items: 1
Shipping Weight (lbs): 3.7
Dimensions (in): 10.2 x 7.4 x 2
ISBN: 0306472929
EAN: 9780306472923
Availability: Usually ships in 1-2 business days
| |
| Also Available In:
|
| Similar Items:
| |
| Editorial Reviews:
Product Description
This text provides students as well as practitioners with a comprehensive introduction to the field of scanning electron microscopy (SEM) and X-ray microanalysis. The authors emphasize the practical aspects of the techniques described. Topics discussed include user-controlled functions of scanning electron microscopes and x-ray spectrometers and the use of x-rays for qualitative and quantitative analysis. Separate chapters cover SEM sample preparation methods for hard materials, polymers, and biological specimens. In addition techniques for the elimination of charging in non-conducting specimens are detailed.
|
| |
| In Stock
|
|
|
| |
|
